SAIF Facilities
- ICP-MS Analysis
- Gas Chromatograph-Mass spectrophotometer
- Kawabata Evaluation System (KES-FB2 Pure Bending Tester)
- Kawabata Evaluation System (KES-FB1-A Tensile and Shear Tester)
- Shimadzu Fourier-Transform Infrared Spectrophotometer
- Scanning Electron Microscope
- BET High Speed Surface Area & Pore Size Analyzer
- Nanoparticle Size Analyzer
- Atomic Force Microscope (AFM)
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Page last updated date:22-04-2024 04:46 PM
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