Sorry, you need to enable JavaScript to visit this website.

Atomic Force Microscope (AFM)

Image of Atomic Force Microscope (AFM)

Full Name of the Instrument/Facility :
Atomic Force Microscope (AFM)
Make :
Veeco (Now: Bruker)
Model :
Innova
Specification :
Contact mode imaging and tapping mode imaging are possible.
Working Principles :
Innova uses a stationary probe and samples are scanned back and forth beneath the probe. The samples are attached to round metal disks that are magnetically attached to the top of the scanner tube. The scanner moves the sample in the x,y and z direction and the probe obtains information from the sample.
Applications :
Nanotechnology, Materials Science, Microbiology
User Instructions :
Samples need to be in suspension or film form. Powder samples can’t be analyzed.
Contact Details :
The In-charge, Test House,
ICAR-CIRCOT, Adenwala Road, Matunga, Mumbai 400019
Telephone: +91-22-24127273, 24127276, 24184274, 24184275 Ext. 456/ 457
URL: www.circot.res.in
e-mail: test[dot]circot[at]icar[dot]gov[dot]in, cottontest[at]rediffmail[dot]com
Usage Charges :
Industry: Rs. 5,000/- per sample
R&D: Rs. 2,500/- per sample
University / Colleges: Rs. 2,500/- per sample.
GST 18% extra.
Additional Information :
Material handling safety information needs to be provided. Unless mentioned, the samples will not be sent back to the user.
Back to Top