Full Name of the Instrument/Facility |
Scanning Electron Microscope | |
Make | Philips Electron Optics B.V. Eindhovan, The Netherlands Scanning Electron Microscope (SEM) | |
Model | XL 30 series Scanning Electron Microscope, Serial Number D 1217 | |
Specification | The XL30 is the conventional Scanning Electron Microscope of the XL Series from Philips and is suitable for a wide variety of applications. The XL30 is a conventional SEM with optimum performance for both imaging and microanalysis of conductive and/or coated specimens. This makes the system ideal for dedicated research in metallography as well as for routine operations such as control monitoring of a manufacturing process, with versatile yet easy to operate software control, the instrument is an excellent tool for both the experienced and first-time user Resolution: 3.5 nm at 30 kV, 25 nm at 1 kV Magnification: 20 X to 1000000 X |
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Working Principle |
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Applications | 1. Nanomaterial’s 2. Metals, Glass, Ceramics and Polymers 3. Semiconductors 4. Plastics 5. Fibers (Textile, Glass, Asbestos, Natural) Surface morphology & Cross section 6. Powder & dust 7. Pharmaceutical powder, pellets (Surface & cross section), Capsules 8. Biological science, 9. Food industry, Chemical industry etc. |
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User Instruction | 1. Sample should be dry and free from moisture 2. If it is wet sample then fixation and dehydration of sample should be done by using Osmium tetroxide and glutaraldehyde. |
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Additional Information |