Full Name of the
Instrument/Facility
  Atomic Force Microscope (AFM)
Make    Veeco (Now: Bruker)
Model    Innova
Specification   Contact mode imaging and tapping mode imaging are possible. 
Working Principle   Innova uses a stationary probe and samples are scanned back and forth beneath the probe. The samples are attached to round metal disks that are magnetically attached to the top of the scanner tube. The scanner moves the sample in the x,y and z direction and the probe obtains information from the sample.
Applications   Nanotechnology, Materials Science, Microbiology
User Instruction   Samples need to be in suspension or film form. Powder samples can’t be analyzed.
Contact Details   The In-charge, Test House,
ICAR-CIRCOT, Adenwala Road, Matunga, Mumbai 400019
Telephone: 022-24127273, 24127276, 24184274, 24184275 Ext. 456/ 457
URL: www.circot.res.in
e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.This email address is being protected from spambots. You need JavaScript enabled to view it.
Usage Charges   Industry: Rs. 5,000/- per sample
R&D: Rs. 2,500/- per sample
University / Colleges: Rs. 2,500/- per sample.
GST 18% extra.
Additional Information   Material handling safety information needs to be provided. Unless mentioned, the samples will not be sent back to the user.